IEEE Xplore Digital Library<\/a> has planned maintenance that includes downtime on July 23rd and 30th 2022. On these dates, content on the IEEE Xplore Digital Library will be unavailable from approximately 9am-11am and 1pm-3pm EST.\r\n\r\nThe IEEE Xplore Digital Library provides full-text access to high-quality technical literature in electrical engineering, computer science, electronics and related disciplines, including journals, magazines and standards published by IEEE (Institute of Electrical and Electronics Engineers) and conference proceedings from both IEEE and the IET (Institution of Engineering and Technology).\r\n\r\n","protected":false},"excerpt":{"rendered":"The IEEE Xplore Digital Library has planned maintenance that includes downtime on July 23rd and 30th 2022. On these dates, content on the IEEE Xplore Digital Library will be unavailable from approximately 9am-11am and 1pm-3pm EST. The IEEE Xplore Digital … Continue reading →<\/span><\/a><\/p>\n","protected":false},"author":438,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[279,31,13],"tags":[],"class_list":["post-42987","post","type-post","status-publish","format-standard","hentry","category-ceaslibrarynews","category-uc","category-uclibraries"],"_links":{"self":[{"href":"https:\/\/libapps.libraries.uc.edu\/liblog\/wp-json\/wp\/v2\/posts\/42987","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/libapps.libraries.uc.edu\/liblog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/libapps.libraries.uc.edu\/liblog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/libapps.libraries.uc.edu\/liblog\/wp-json\/wp\/v2\/users\/438"}],"replies":[{"embeddable":true,"href":"https:\/\/libapps.libraries.uc.edu\/liblog\/wp-json\/wp\/v2\/comments?post=42987"}],"version-history":[{"count":4,"href":"https:\/\/libapps.libraries.uc.edu\/liblog\/wp-json\/wp\/v2\/posts\/42987\/revisions"}],"predecessor-version":[{"id":42993,"href":"https:\/\/libapps.libraries.uc.edu\/liblog\/wp-json\/wp\/v2\/posts\/42987\/revisions\/42993"}],"wp:attachment":[{"href":"https:\/\/libapps.libraries.uc.edu\/liblog\/wp-json\/wp\/v2\/media?parent=42987"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/libapps.libraries.uc.edu\/liblog\/wp-json\/wp\/v2\/categories?post=42987"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/libapps.libraries.uc.edu\/liblog\/wp-json\/wp\/v2\/tags?post=42987"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}
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\r\n\r\nThe IEEE Xplore Digital Library<\/a> has planned maintenance that includes downtime on July 23rd and 30th 2022. On these dates, content on the IEEE Xplore Digital Library will be unavailable from approximately 9am-11am and 1pm-3pm EST.\r\n\r\nThe IEEE Xplore Digital Library provides full-text access to high-quality technical literature in electrical engineering, computer science, electronics and related disciplines, including journals, magazines and standards published by IEEE (Institute of Electrical and Electronics Engineers) and conference proceedings from both IEEE and the IET (Institution of Engineering and Technology).\r\n\r\n","protected":false},"excerpt":{"rendered":"